Table 1 Comparison of the deposited number of atoms calculated both from the Atomic Flux Divergence model and experimental measurements on two similar size grains on sample S3 for two different time periods of 120 and 240 h.

From: Tunable Ultra-high Aspect Ratio Nanorod Architectures grown on Porous Substrate via Electromigration

Time (h)

Number of atoms (Grain 1)

Number of atoms (Grain 2)

Atomic Flux Divergence

Model (AFD)

Experimental

Measurement

Atomic Flux Divergence

Model (AFD)

Experimental

Measurement

120

2.37 × 106

5.92 × 107

2.53 × 106

5.85 × 107

240

4.74 × 106

1.32 × 108

5.06 × 106

1.49 × 108