Figure 4
From: A programmable nanoreplica molding for the fabrication of nanophotonic devices
(a) The SPR reflection dips for plasmonic slabs fabricated with 0%, 2.5%, 5%, 7.5%, 10%, 15%, 20%, 25%, 30%, and 35% strain. The split between the dips for x- and y-polarizations follows the lattice period deviations in the x-direction (elongation) and y-direction (compression). (b) Plasmonic resonance wavelength with respect to applied strain. The SPR dips in the stretched and compressed directions from the experimental data in (a) are shown by the red dots and blue squares, respectively; linear fits to the resonance wavelengths, by the solid red and dashed blue lines. The error bars represent the standard deviation of 10 measurements taken at different locations on the sample.
