Figure 6

SEM images (a and c) and their corresponding CL images (b and d) of the as-obtained silica NPs and NWs. The images were obtained with a focused electron beam at an accelerating voltage of 30 kV.

SEM images (a and c) and their corresponding CL images (b and d) of the as-obtained silica NPs and NWs. The images were obtained with a focused electron beam at an accelerating voltage of 30 kV.