Figure 5: Low temperature ESR spectra after 1000 °C annealing.

The X-band ESR spectra of Si NCs/SiO2 multilayers after 1000 °C annealing are detected at 2 K.
The X-band ESR spectra of Si NCs/SiO2 multilayers after 1000 °C annealing are detected at 2 K.