Figure 2
From: Experimental phase determination of the structure factor from Kossel line profile
Experimental setup.
A focused monochromatic synchrotron x-ray beam was used to excite atoms in the sample. The emitted fluorescent radiation (modulated by the interference between the direct and Bragg reflected beams) were recorded with a 2D pixel detector. To increase the solid angle covered by the measurement, the detector assembly can be moved.
