Figure 2 | Scientific Reports

Figure 2

From: In-situ Observation of Size and Irradiation Effects on Thermoelectric Properties of Bi-Sb-Te Nanowire in FIB Trimming

Figure 2

Electron diffraction patterns of the pristine and trimmed BST NWs.

(a) The SAED pattern of pristine NW with diameter 750 nm and the inset shows the HRTEM picture with d110 = 0.21 nm. (b) The SAED pattern of the trimmed 285 nm NW. The upper right corner is the correlated diffraction pattern collected from SAED result, which identifies the BST (dot line) and Ga (solid line) are both presented in the specimen. Inset shows the HRTEM image of polycrystalline lattice structure, the dash lines are eye guides for the lattice discontinuity. All diffraction patterns are taken along [001] zone axis.

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