Figure 1 | Scientific Reports

Figure 1

From: Geometry- and Length Scale-Dependent Deformation and Recovery on Micro- and Nanopatterned Shape Memory Polymer Surfaces

Figure 1

Morphological analyses of original pattern, deformed pattern under different tensile strains and recovered pattern.

(a) 200 nm-grating, (b) 2 μm-grating, (c) 250 nm-pillars and (d) 200 nm-holes. Left: topographic AFM images; Centre: corresponding height profiles from AFM images; Right: top-view SEM images. Note that the scales for x- and y-axes in the height profiles of AFM are different so as to clearly present the values of dimensions on surface topographies.

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