Figure 4

TEM micrographs of brazed region sintered at 1180 °C for 4 min followed by aged at 520 °C for 30 min: (a) schematic areas of the following TEM characterization, (b) Ni₄Ti₃ precipitates accompanied with rounded Ti₂N particle, (c) Ni₄Ti₃ precipitates along with TiC particle, (d) R phase precipitates accompanying dislocation loops (L) and high density dislocation (HD) with a TEM SAED pattern of R phase region (inset) and (e) R phase present nearby eutectic region.