Figure 3: X-ray photoelectron spectroscopy (XPS) depth profiles of neat (I) and (I)/polystyrene (40/60 wt%) films. | Scientific Reports

Figure 3: X-ray photoelectron spectroscopy (XPS) depth profiles of neat (I) and (I)/polystyrene (40/60 wt%) films.

From: Solution-Processed Donor-Acceptor Polymer Nanowire Network Semiconductors For High-Performance Field-Effect Transistors

Figure 3

(a,b) are depth profiles of elements (C, S, O and Si) in respectively neat (I) and (I)/polystyrene film; (c) relative concentrations of carbon as a function of film depth in neat (I) and (I)/polystyrene film; and (d) relative concentrations of sulfur as a function of film depth in neat (I) and (I)/polystyrene film.

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