Figure 5: Line profiles of electron energy loss spectroscopy (EELS) spectra, for films (a) A, (b) B, (c) D and (d) E. | Scientific Reports

Figure 5: Line profiles of electron energy loss spectroscopy (EELS) spectra, for films (a) A, (b) B, (c) D and (d) E.

From: A study on the electron transport properties of ZnON semiconductors with respect to the relative anion content

Figure 5

Line scan profiles starting from the top capping ZnO layer indicate that film A contains only nitrogen cations indicated in (a), of which the concentration decreases with increasing O2 flow rate, ultimately becoming negligible in film E (pure ZnO) as shown in (d). The relative concentration of oxygen anions increases accordingly from film A to E.

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