Figure 1

(a) XRD pattern, (b) SEM image and (c) EDS of a representative Bi₂Se₃ thin film with the t = 36 nm grown on a SrTiO₃(111) substrate. (d) AFM topography with the height profile across a 40 nm thick Bi₂Se₃ thin film. The left and right insets are the 3D and 2D topographies, respectively.