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Figure 1

From: Strong infrared photoluminescence in highly porous layers of large faceted Si crystalline nanoparticles

Figure 1

Sample characterization.

(a–d) Transmission electron microscopy (TEM) images of the octahedral (a–c) and irregular Si NP’s (d). The size of the octahedral Si NP’s (80 nm, 110 nm, 140 nm) is determined as the length of 220 plane (edge of the triangular facet). For the irregular Si NP the size is the particle average diameter. Note that the octahedral Si NP’s in (b) and irregular Si NP’s in (d) have very similar size. (e) Scanning electron microscope (SEM) plan view of a 2 μm thick layer formed by octahedral Si NP’s. (f–i) X-ray diffraction (XRD) Bragg peaks related to the (111), (220), (311), (004) for octahedral (black) and irregular (red) Si NP’s. All the octahedral NP’s show the same peak width and intensity after normalization. In the figure, the intensity of the peaks was normalized to the (111) contribution, in order to highlight the nonrandom distribution of the octahedral Si NP’s. Complete XRD spectra with markers are included as Supplemental Information.

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