Figure 5 | Scientific Reports

Figure 5

From: Self-Heating and Failure in Scalable Graphene Devices

Figure 5

Raman and thermal imaging of two CVD covered devices failing at (a–d) 57 mW/μm and (e–h) 21 mW/μm (a,e) Raman images of 2D-mode peak position before self-heating. The 2D-mode peak position is more uniform for the higher performing device in (a). (b,f) Measured temperature distribution while dissipating ~515 mW of power. The temperature field is more uniform in (b) than (f) owing to the multilayer regions that exist in the latter. (c,g) Raman image of 2D-mode peak position after failure. (d,h) Overlay of Raman and infrared images indicating that the failure is co-located with regions of most severe heating. The grounded electrode is on the right-hand side.

Back to article page