Table 1 Experimental results for nanomechanical probing in 5 InSe nanolayers.

From: Nanomechanical probing of the layer/substrate interface of an exfoliated InSe sheet on sapphire

Flake

Thickness, d, AFM (nm)

Frequency, f, (GHz)

Measured

Calculated

Eq. (2), n = 1

Eq. (3), n = 1

Eq. (3), n = 2

1

114 ± 2

11.6 ± 0.4

11.0

5.5

16.4

2

100 ± 4

13.3 ± 0.1

12.5

6.3

18.9

3

94 ± 5

13.4 ± 0.3

13.3

6.6

19.9

4

57 ± 4

26.2 ± 1.1

21.9

11.0

32.9

5

54 ± 3

23.1 ± 0.6

23.1

11.6

34.7

  1. The measured values of f are obtained from the FFT spectra. The calculated values of f are obtained using Eq. (2) and Eq. (3). The calculated values marked by bold have the best agreement with the measured values. The results for Flake 1 are described in detail in the text.
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