Figure 1
From: Atomic-resolved depth profile of strain and cation intermixing around LaAlO3/SrTiO3 interfaces
Representative HAADF images of LaAlO3 films grown pseudomorphically on SrTiO3.
HAADF of (a) 10 u.c. (b) 3 u.c. (c) 5 u.c.-thick films deposited on a SrTiO3 substrate. The same process conditions were used to deposit the films. The interfaces are shown by a red arrow. No misfit dislocations could be detected at LAO/STO interfaces along the entire distance observed via Nion UltraSTEM. The left inset in (a) highlights the off-center displacement of Ti near the interface.
