Figure 4
XPS spectra corresponding to (a) Ta-4d, (b) Ta-4f (c) Co-2p and (d) Fe-2p electronic levels recorded on Si/CFA (53 nm)/Ta(2 nm) thin film deposited at Ts ~ 573 K.
Figure 4 | Scientific Reports
XPS spectra corresponding to (a) Ta-4d, (b) Ta-4f (c) Co-2p and (d) Fe-2p electronic levels recorded on Si/CFA (53 nm)/Ta(2 nm) thin film deposited at Ts ~ 573 K.
