Figure 4
From: Inverse spin Hall effect in a complex ferromagnetic oxide heterostructure
XRD charakterisation.
(a) Omega-2Θ-scan of the 220-reflection of sample 7 (LSMO 30 nm/SRO 23 nm). The fit is in excellent agreement with the measurement and reproduces the thickness-fringes indicating low interface roughness. (b) Rocking curves for the same sample reveal a FWHM of 0.01° for the substrate and 0.1° for the LSMO and SRO layers. This is more than has been reported for other PLD grown oxide layers of similar thickness33,34and indicates a maximum mosaicity of 0.1° in both LSMO and SRO, respectively.
