Figure 8
Summary of 1-layer to 200-layer structures with (a) optimized responsivity values and (b) their corresponding structures for MoS2 (solid lines), graphene (dotted lines) and h-BN (dashed lines) devices with λ = 405 nm (purple lines), 532 nm (green lines) and 633 nm (red lines). The optimal d2 values around λ/2 are shown (the results are periodic about mλ/2). The saw teeth patterns in d2 curves (mostly visible for MoS2) result from the |ℜ| peaks alternating between positive and negative peaks, which can also be noticed in the |ℜ| plot in (a). The color bars on top illustrates the ranges of thickness (in number of layers) for each 2D material to have the highest |ℜ| with optimized device structure, with number of layers labeled for each new thickness range.
