Figure 3

HAADF-STEM and STEM-EELS from interfacial region.
(a) Region of interest selected from HAADF-STEM imaging. (b) HAADF-STEM signal showing atomic resolution imaging produced concurrently with EELS acquisition. (c) Spatially resolved intensity of O K edge signal. Lower intensity observed on alternate positions in the substrate is due to the shared (with Sr) atomic columns: Sr-O. Open circles outline the twinning (also demonstrated by the SAD pattern) of the O sublattice across the interface. Note that the positions of the dashed yellow and white line are the same as in Fig. 2. (d) Spatially resolved intensity of Ti L2,3 signal. (e) Spatially resolved intensity of Fe L2,3 edge signal. (f) Line profiles along the area outlined in (b) for O, Ti and Fe signals, colour coded as in (c–e); the HAADF signal intensity is the grey curve. The clear cross-over from Ti to Fe dominated features at 1 nm on the linescan (i.e. at the reference plane) indicates Fe chemical nature of the interfacial atomic columns identified as ‘a’ and ‘b’.