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Figure 2

From: Switching of both local ferroelectric and magnetic domains in multiferroic Bi0.9La0.1FeO3 thin film by mechanical force

Figure 2

(a) XRD pattern of Bi0.9La0.1FeO3 thin film deposited on Pt/TiO2/SiO2/Si substrate; the inset showing a cross-sectional SEM image of the as-deposited thin film; film thickness of as-deposited thin film is ~219 nm, at this thickness, a piezoresponse can be recorded easily and the minimum switching field increases when the film thickness is increased. (b) EDX element analysis spectrum and (c) element mapping.

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