Figure 3
Electrical characterization of CFO/BTO bilayers.
(a) Polarization – voltage loops of tCFO = 35 nm CFO/BTO bilayer and the corresponding BTO single film (tCFO = 0 nm). (b) Leakage current density versus voltage curves corresponding to tCFO = 0 and 50 nm samples. (c) Remnant polarization versus CFO thickness (note that three different tCFO = 50 nm samples were fabricated). The vertical bar in tCFO = 0 nm indicates the range of polarization values measured in the series of single BTO films on LNO/CeO2/YSZ/Si(001) reported in ref. 6.
