Figure 3
From: Light-induced rotations of chiral birefringent microparticles in optical tweezers
(a) Rotational frequencies of trapped particles as a function of the field ellipticity (angle φ) as measured on chiral microparticles of different size, for different power and wavelength, as summarized in the legend. Error bars represent the standard deviation from the mean value from the analysis of 3 set of transverse ACFs signals in the same experimental conditions. Continuous lines are best fit to the data following Eq. 5. (b) Frequency data scaled with respect to their maximum and compared with the expected behaviour if only reflection was the cause of the induced optical torque (black line). Reflectivity (c) and optical retardance (d) values and uncertainties obtained from the fit of the measured frequencies in (a) as a function of particle radius. Error bars on the radii represent an uncertainty of about 5% for the trapped particle size measurement from CCD images.
