Figure 1

(a) The conventional θ–2θ XRD scans (λ = 0.1393 nm) of Fe2O3 photoanodes fabricated using UL and surfactant, (b) Changes in normalized diffraction intensity of hematite planes, and (c) Williamson-Hall plot. (d) Fe K-edge XANES spectra, and (e) k3-weighted Fourier transforms of Fe K-edge EXAFS functions for different Fe2O3 photoanodes.