Figure 2: Partially GO-coated Si samples.

FE-SEM images and optical images (top-view images) of (a–c) P-GO and (d–f) Annealed p-GO samples. (g) The ratio of GO coverage and (h) contact angles on the Si surface, P-GO, and Annealed p-GO samples. In (h), the insets show the optical images of water droplets for contact angle measurement.