Figure 3: Raman and XPS measurements for partially GO-coated Si samples. | Scientific Reports

Figure 3: Raman and XPS measurements for partially GO-coated Si samples.

From: Effect of graphene oxide ratio on the cell adhesion and growth behavior on a graphene oxide-coated silicon substrate

Figure 3

(a,b) Optical images and (c,d) Raman spectra of P-GO and Annealed p-GO samples. Three different positions on partially GO-coated samples, selected as Spots A, B, and C, are positioned at the inside, outside, and boundary of the thin GO films, respectively. (e,f) C1s core-level spectra of P-GO and Annealed p-GO samples.

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