Figure 1
From: Misfit Strain Relaxation of Ferroelectric PbTiO3/LaAlO3 (111) Thin Film System
(a) Low-magnification cross-sectional HAADF images showing the morphology of PTO thin films grown on the LAO substrate. (b) Cross-sectional bright-field image of the PTO/LAO heterostructure showing the accumulation of a high density of defects near the interface. The interface is marked by a pair of white arrows. (c) Composite EDPs of (c) [10
]f and (d) [11
]f. Spot splitting due to the different lattice parameters of PTO and LAOP can be observed. Subscripts s and f denote the LAO substrate and PTO films, respectively.
