Figure 2
From: Misfit Strain Relaxation of Ferroelectric PbTiO3/LaAlO3 (111) Thin Film System
(a,b) Two-beam dark-field images of cross-sectional PTO/LAO thin films by using (222) and (1
1) reflections, respectively. High density misfit dislocations may accumulate at the interface as denoted by arrow in (b).
