Figure 4
From: Misfit Strain Relaxation of Ferroelectric PbTiO3/LaAlO3 (111) Thin Film System
Low magnification HRSTEM image of the PTO thin film on LAO substrates taken along [10
] direction.
Vertical arrows denote the positions of interfacial dislocations. (b) In-plane strain εxx mapping corresponding to Fig. 4(a) showing the strain variations at the interfaces and in the films.
