Figure 6
Bendability measurements by using the in-house prepared bending machine showing the remarkable flexible properties of as prepared resistive switching device.
(a) Endurance curve showing HRS and LRS values for 1500 bending cycles at a fixed diameter value of 10 mm. (b) Endurance plot clearly showing very less deviation in HRS and LRS with changing values of bending diameters in the range of 30 mm to 2 mm. The device behaved like an open circuit at a bending diameter of 2 mm. Optical images of as top and bottom electrodes at different values of bending diameters. (c) Before bending. (d) Appearance of micro-cracks in bottom electrode. (e) Development of a major crack in the bottom electrode and completely broken top electrode at a bending diameter of 2 mm resulting in the open circuit of memory device.
