Figure 7
(A) Reflectance at normal incidence of the optical radiation onto a TiO2 film placed between two dielectric media (2 mm plate of fused silica and air or AlOOH layer) as a function of wavelength. Black and red curves correspond to reflectance at normal incidence of the optical radiation onto 2 mm fused silica and 0.5 mm AlOOH layer; (B) Dispersion of refractive indices of fused silica and AlOOH within the visible spectral range obtained in case of one reflection border; (C) Reflectance at normal incidence of the optical radiation onto a TiO2 film placed between two dielectric media (2 mm plate of fused silica and air or AlOOH layer) as a function of wavelength. Indices (1) and (2) denote different film thickness; (D) Visibility V of interference fringes in reflected light for TiO2 and TiO2/AlOOH films. V = (Imax − Imin)/(Imax + Imin), where Imax,min means intensity of reflected light in minima and maxima. Average values of V within the entire spectral range for TiO2 and TiO2/AlOOH films are 0.56 and 0.74.
