Figure 4 | Scientific Reports

Figure 4

From: Atomic Resolution Interfacial Structure of Lead-free Ferroelectric K0.5Na0.5NbO3 Thin films Deposited on SrTiO3

Figure 4

Strain mapping of the KNN/STO interface.

(a) The atomic-resolution HAADF image of KNN/STO interface without dislocations; (b–d) the GPA Exx (in-plane strain), Eyy (out-of-plane strain) and Exy (shear strain) maps of (a), respectively; (e) the atomic-resolution HAADF image of KNN/STO interface with a dislocation; (f–h) the GPA relative a, c-lattice strain and shear strain maps of (e), respectively. The positive and negative values of E indicate the measured local lattice is larger and smaller than the reference lattice, respectively.

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