Figure 4 | Scientific Reports

Figure 4

From: Multi-Scale-Porosity TiO2 scaffolds grown by innovative sputtering methods for high throughput hybrid photovoltaics

Figure 4

Ellipsometric measurements.

Spectroscopic Ellipsometric measurements of experimental (symbols) and generated (lines) curves at 55° and 65° angles of incidence of Ψ (a), and of Δ (b) for the gig-lox layer as deposited; (c) transmission data (symbols) and simulated (lines) for gig-lox layer annealed at 500 °C and gig-lox layer annealed at 500 °C + N-719, (d,e) the calculated refractive index (n) and extinction coefficient (k) of ppg and gig-lox layers before and after annealing at 500 °C and for the gig-lox layer after annealing at 500 °C + N-719.

Back to article page