Figure 2: The XRD diffraction patterns of SnS film with different Sn compensation source temperature. | Scientific Reports

Figure 2: The XRD diffraction patterns of SnS film with different Sn compensation source temperature.

From: Tin Compensation for the SnS Based Optoelectronic Devices

Figure 2

(a) shows the rocking curve of SnS (004) plane; (b) and (c) are the 2θ-ω scans in the range of 10° to 70° and 28° to 35°, respectively. (A: control sample without Sn compensation; B: TSn = 730 °C; C: TSn = 750 °C; D: TSn = 800 °C).

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