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Figure 1

From: Cr incorporated phase transformation in Y2O3 under ion irradiation

Figure 1

(a) Bright-field cross-sectional TEM image of pristine the FeCr/Y2O3 trilayer thin film. (b) is the selected area electron diffraction pattern. (c) HRTEM micrograph of the Y2O3/FeCr interface. (d) Magnified HRTEM image of cubic Y2O3 indicated by the blue dashed square in (c). (e) Dark field STEM image reveals a chemically abrupt interface. (e1) EELS line scan across the M/O interface and (e2) EDS composition profile across the grain boundary in FeCr layer.

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