Figure 2 | Scientific Reports

Figure 2

From: Enhanced thermoelectric performance of a chalcopyrite compound CuIn3Se5−xTex (x = 0~0.5) through crystal structure engineering

Figure 2

High resolution transmission electron microscopy (HRTEM) image observed in CuIn3Se4.9Te0.1, (a) The selected area electron diffraction (SAED) pattern; (b) Chemical compositions analyses using EDS spectra; (c) High resolution TEM image, showing a conventional polycrystalline structure consisting of many nano-domains; (d) Magnified high resolution TEM image, which shows that the spacing between (112) crystal planes is about 0.345 nm.

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