Figure 1

(a,b) SEM images of the educt Ge powders obtained by milling of Ge wafers (c) Primary particle size distribution of educt powders extracted from SEM images. (d) Experimental setup of LML using a liquid jet passage reactor. (e) XRD patterns of products obtained from laser irradiation of Ge powders in water and isopropanol as well as the XRD pattern of the educt powder. (f,g) TEM images of synthesized Ge SMSs after 100 liquid jet passages in water and isopropanol, respectively.