Figure 3
From: Holographic image generation with a thin-film resonance caused by chalcogenide phase-change material

(a) Schematic diagram for illustrating the major variation of the optical spectrum when amorphous (or crystalline) thin GST film is inserted into ITO on a metal substrate. (b) Simulation (blue dash-dotted) and experimental (red solid) results of the reflection spectra to observe the effects of the GST thickness. (c) Reflectance and reflection phase of the IGI composite layer designed for broadband visible light diffraction (IGI 30/7/30 nm). The upper-right inset shows the abrupt phase difference of reflected light as measured by a Michelson interferometer experiment. (d) The upper-side plots show the experimental results of the reflection spectra for amorphous (solid lines) and crystalline (dashed lines) GST inserted panels designed for red, green, and blue color-selective diffraction. The lower-side plots show the numerical results of the reflection phase difference between the amorphous and crystalline GST insertion cases. The bottom images show the color of reflection panels and their IGI thickness conditions.