Figure 3

Atomic force micrographs and selected area electron diffraction patterns showing; (a–d) 1 μm scans of the FeRh films as a function of increasing thickness which demonstrates the formation of island growth due to strain relaxation and formation of dislocation leading to Volmer-Webber type growth. The inserts show the indexed TEM diffraction patterns in which green is used to highlight the 020/200 spots from the MgO phase and red to highlight 010/100 spots from the FeRh. (e) Schematic representation of the relative orientations of the two lattices with the FeRh B2 lattice orientated along the [110] inplane direction, 45° misoriented relative to the MgO cubic [200] direction.