Figure 4: Numerically determined thermal hysteresis loops as a function of FeRh thickness (data offset for clarity), with a 1.5 nm antiferromagnetic layer and the total thickness shown by the labels. | Scientific Reports

Figure 4: Numerically determined thermal hysteresis loops as a function of FeRh thickness (data offset for clarity), with a 1.5 nm antiferromagnetic layer and the total thickness shown by the labels.

From: Substrate Induced Strain Field in FeRh Epilayers Grown on Single Crystal MgO (001) Substrates

Figure 4

As the thickness of the layers is decreased there is an increase in the transition temperature consistent with the experimental measurements of Fig. 1(a). For the 2.5 nm case there is no detectable phase transition.

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