Figure 3
The (a) RH and RL and (b) VSET and VRESET distributions of the AlN TRRAM devices under ambient conditions of vacuum (Vac.), air, nitrogen (N2), and oxygen (O2).
Figure 3 | Scientific Reports
The (a) RH and RL and (b) VSET and VRESET distributions of the AlN TRRAM devices under ambient conditions of vacuum (Vac.), air, nitrogen (N2), and oxygen (O2).
