Figure 2: AFM and plan-view TEM images of GaN templates on sapphire and silicon substrates. | Scientific Reports

Figure 2: AFM and plan-view TEM images of GaN templates on sapphire and silicon substrates.

From: A comparative study of efficiency droop and internal electric field for InGaN blue lighting-emitting diodes on silicon and sapphire substrates

Figure 2

AFM images of a GaN template on (a) sapphire (TDD: 3.8 × 108 cm−2) and (b) silicon (TDD: 5.3 × 108 cm−2). Plan-view TEM images of a GaN template on (a) sapphire and (b) silicon. The scale bar of both AFM and plan-view TEM images is 0.5 μm.

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