Figure 3: Displacements, strains and stresses after FIB milling (crystal C).

(A) 3D rendering of crystal C reconstruction coloured by lattice displacement magnitude. q vectors of the six measured reflections are superimposed. (B) Crystal coordinates and section on which the lattice strains are plotted. The x, y and z axes correspond to [-12-1], [111] and [10-1] crystal directions respectively. (C) Maps of the six independent lattice strain tensor components plotted on the xy section shown in (B). (D) Magnified view of amplitudes and phases of the complex electron density reconstructed from {200} reflections. The region corresponds to that marked by a black box in (C) and is centred on a defect. Areas of reduced amplitude (white arrows) and phase jumps (in radians, circular arrows) are visible in the (020) and (002) reflections. (E) Semi-transparent rendering of the outer crystal shape. Superimposed are iso-surfaces of von Mises stress (300 MPa (blue), 400 MPa (green), 500 MPa (red)). Three different viewpoints are shown. In the middle view dashed black lines have been superimposed as a guide to the eye to illustrate the arrangement of defects in lines. Scale bars correspond to 300 nm in (A–C) and (E), and 100 nm in (D).