Figure 5: Strains induced by extensive FIB milling (crystal D).
From: 3D lattice distortions and defect structures in ion-implanted nano-crystals
(A) 3D rendering of crystal D coloured according to the measured lattice displacement magnitude. Superimposed are the q vectors of the six reflections measured from this crystal. (B) Crystal coordinates and sections on which strains are plotted. The x, y and z axes correspond to [2-1-1], [111] and [0-11] crystal directions respectively. (C) and (D) show the six components of the experimentally measured strain tensor plotted on xy and yz sections through the crystal (shown in (B) coloured red and green respectively). Scale bars are 300 nm in length.
