The effectiveness of energy-resolved (ER) X-ray photoelectron spectroscopy (XPS) with synchrotron radiation (SR) soft X-ray source for analysis of the outermost chemical composition of polymer materials is demonstrated. The surface molecular aggregation state of poly(ethylene glycol) (PEG)/poly(perfluorooctylethyl acrylate) (PFA-C8) was confirmed using ER-XPS. The XPS with SR soft X-ray source detect only the single bilayer structure of the PFA-C8 component, whereas the XPS with Mg Kα X-ray source detect both the PFA-C8 component at the outermost surface and PEG component at the interior.
- Shiki Nojima
- Takamichi Shinohara
- Atsushi Takahara
