A more straightforward and general scheme to measure electron spin coherence based on Kerr rotation but modified so that a spin projection measurement can be done on an arbitrary set of basis states has been developed. This allows a direct tomographic measurement of electron spin precession in a semiconductor structure, and offers a universal tool for performing preparation and read-out of a spin quantum state in a solid.
- Hideo Kosaka
- Takahiro Inagaki
- Keiichi Edamatsu