We propose a simple method to detect depth information of ink components and pigment distribution observed by transmission electron microscopy on commercially available cosmetic contact lenses using multiple probes such as STEM EDS, XPS, HAXPES, and XAFS. These provide important information on the safety of cosmetic contact lenses, which are medical devices.
- Eri Ito
- Hiroshi Takase
- Katsuhiro Yamamoto
