Filter By:

Journal Check one or more journals to show results from those journals only.

Choose more journals

Article type Check one or more article types to show results from those article types only.
Subject Check one or more subjects to show results from those subjects only.
Date Choose a date option to show results from those dates only.

Custom date range

Clear all filters
Sort by:
Showing 1–3 of 3 results
Advanced filters: Author: Mikhail I. Vexler Clear advanced filters
  • This Perspective assesses the performance limits of hexagonal boron nitride when used as a gate insulator in complementary metal–oxide–semiconductor (CMOS) devices based on two-dimensional materials, concluding that due to excessive leakage currents, the material is unlikely to be suitable for use in ultrascaled CMOS devices.

    • Theresia Knobloch
    • Yury Yu. Illarionov
    • Tibor Grasser
    Reviews
    Nature Electronics
    Volume: 4, P: 98-108
  • The lack of scalable, high-quality insulators is a major problem hindering the progress on electronic devices built from 2D materials. Here, the authors review the current state-of-the-art and the future prospects of suitable insulators for 2D technologies.

    • Yury Yu. Illarionov
    • Theresia Knobloch
    • Tibor Grasser
    ReviewsOpen Access
    Nature Communications
    Volume: 11, P: 1-15