Dark field X-ray microscopy is a powerful tool for studying strain and orientation in crystalline materials, but limitations persist for imaging highly deformed microstructures. Here, using a pink X-ray beam enables a 27-fold increase in diffraction intensity, allowing recrystallized and deformed grains in aluminum and iron to be clearly imaged.
- Can Yildirim
- Aditya Shukla
- Henning Friis Poulsen
