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Showing 1–5 of 5 results
Advanced filters: Author: Omur E. Dagdeviren Clear advanced filters
  • Precise thin film growth is pivotal for applications in electronics and coatings, yet kinetics-dominated film morphology remains challenging to control. Here, the authors utilize three-dimensional atomic force microscopy to achieve sub-nanometer precision in measuring the Ehrlich-Schwoebel barrier on Au (111) surfaces, offering a detailed real-space view that enhances thin film design strategies.

    • Bugrahan Guner
    • Mehmet Z. Baykara
    • Omur E. Dagdeviren
    ResearchOpen Access
    Communications Materials
    Volume: 7, P: 1-10
  • Nanoimprinting is a technique where the surface features of a mould can be transferred onto a replica and is relevant to the production of nanostructured devices. The authors report a method that enables the imprinting of structural features of SrTiO3 single crystals at the atomic level into a replica made from bulk metallic glass.

    • Rui Li
    • Zheng Chen
    • Udo D. Schwarz
    ResearchOpen Access
    Communications Physics
    Volume: 1, P: 1-6
  • High-energy ultraviolet (UVC) irradiation induces surface oxygen vacancies in metal oxides used in energy, sensing, and biomedical applications, but there is no consensus on its penetration depth. Here, using optical transmission and time-resolved atomic force microscopy, the authors observe UVC irradiation hundreds of micrometers deep into the bulk of titanium dioxide samples – orders of magnitude larger than previously postulated values.

    • Bugrahan Guner
    • Mohammad Safikhani-Mahmoudi
    • Omur E. Dagdeviren
    ResearchOpen Access
    Communications Chemistry
    Volume: 8, P: 1-7
  • Metallic glasses display a high yield strength and typically deform via heterogeneous shear bands beyond the yield point. Here, deformation of as little as 1000 atoms in a Pt-based metallic glass at room temperature leads to near-theoretical yield strength, beyond which homogeneous deformation occurs.

    • Jiaxin Yu
    • Amit Datye
    • Udo D. Schwarz
    ResearchOpen Access
    Communications Materials
    Volume: 2, P: 1-11