For the development of wearable and stretchable devices, stretchable and flexible semiconductive materials are desired. To understand the mechanical behavior of structural deformation of polythiophene with disiloxane groups, we performed in situ measurements under stretching using X-ray diffraction of synchrotron radiation and polarized infrared spectroscopy. The behaviors of amorphous region was oriented during the initial deformation, while the orientation of crystallites began after permanent set.
- Jian Shen
- Masaki Kashimoto
- Takashi Nishino
